High-Performance Carbon Nanotube Electronic Devices: Progress and Challenges

As silicon-based complementary metal-oxide-semiconductor (CMOS) technology approaches its physical and scaling limits at sub-3-nanometer nodes, critical challenges including the short-channel effect (SCE), surging power consumption, and aggravated parasitic effects have severely constrained further...

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Bibliographic Details
Main Authors: Zirui Zhang, Nie Zhang, Zhiyong Zhang
Format: Article
Language:English
Published: MDPI AG 2025-05-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/16/5/554
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