Takeda, M., Hofmann, A., Brütting, W., & Noguchi, Y. Degradation Properties of Organic Light‐Emitting Diodes with Modified Interface Charge Density via Dipolar Doping Studied by Displacement Current Measurement. Wiley-VCH.
Chicago Style (17th ed.) CitationTakeda, Mihiro, Alexander Hofmann, Wolfgang Brütting, and Yutaka Noguchi. Degradation Properties of Organic Light‐Emitting Diodes with Modified Interface Charge Density via Dipolar Doping Studied by Displacement Current Measurement. Wiley-VCH.
MLA (9th ed.) CitationTakeda, Mihiro, et al. Degradation Properties of Organic Light‐Emitting Diodes with Modified Interface Charge Density via Dipolar Doping Studied by Displacement Current Measurement. Wiley-VCH.
Warning: These citations may not always be 100% accurate.