APA (7th ed.) Citation

Li, M., Wang, X., Zhang, H., & Hu, X. An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection. IEEE.

Chicago Style (17th ed.) Citation

Li, Mengyun, Xueying Wang, Hongtao Zhang, and Xiaofeng Hu. An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection. IEEE.

MLA (9th ed.) Citation

Li, Mengyun, et al. An Improved YOLOv7-Tiny-Based Algorithm for Wafer Surface Defect Detection. IEEE.