APA (7th ed.) Citation

Sun, J., & Tian, C. CPLD-Based Displacement Measurement System for Nanoscale Grating Ruler. Wiley.

Chicago Style (17th ed.) Citation

Sun, Jiyuan, and Chunlin Tian. CPLD-Based Displacement Measurement System for Nanoscale Grating Ruler. Wiley.

MLA (9th ed.) Citation

Sun, Jiyuan, and Chunlin Tian. CPLD-Based Displacement Measurement System for Nanoscale Grating Ruler. Wiley.

Warning: These citations may not always be 100% accurate.