2DEG properties of AlScN/GaN and AlYN/GaN HEMTs determined by terahertz optical Hall effect
We present a contactless determination of the two-dimensional electron gas (2DEG) properties in AlScN/GaN and AlYN/GaN high electron mobility transistor (HEMT) structures using the terahertz optical Hall effect (OHE) over a temperature range of 20 K–360 K. The structures are grown on sapphire or 4H-...
Saved in:
| Main Authors: | V. Stanishev, I. Streicher, A. Papamichail, V. Rindert, P. P. Paskov, S. Leone, V. Darakchieva |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Frontiers Media S.A.
2025-07-01
|
| Series: | Frontiers in Electronic Materials |
| Subjects: | |
| Online Access: | https://www.frontiersin.org/articles/10.3389/femat.2025.1622176/full |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Interfacial Polarization Switching in Al0.92Sc0.08N/GaN Heterostructures Grown by Sputter Epitaxy
by: Niklas Wolff, et al.
Published: (2025-08-01) -
Ex situ observation of ferroelectric domain evolution in wurtzite-type AlScN thin films
by: Wolff Niklas, et al.
Published: (2024-01-01) -
Adsorption Characteristics of an AlGaN/GaN Heterojunction on Potassium Ions
by: Yan Dong, et al.
Published: (2025-06-01) -
TCAD analysis of the high-temperature reverse-bias stress on AlGaN/GaN HEMTs
by: Franco Ercolano, et al.
Published: (2025-03-01) -
ScAlN/GaN-on-Si (111) HEMTs for RF applications
by: Seif El Whibi, et al.
Published: (2025-01-01)