APA (7th ed.) Citation

Wang, S., Kong, Z., Zhao, J., Guan, S., Zhao, R., Ju, A., . . . Lian, P. Dopant Diffusion‐Induced Dielectric Breakdown: Stacked Dielectric Reliability on Heavily Doped Polysilicon. Wiley-VCH.

Chicago Style (17th ed.) Citation

Wang, Shuo, Zebin Kong, Jie Zhao, Shukai Guan, Ranran Zhao, Anan Ju, Kunshu Wang, and Pengfei Lian. Dopant Diffusion‐Induced Dielectric Breakdown: Stacked Dielectric Reliability on Heavily Doped Polysilicon. Wiley-VCH.

MLA (9th ed.) Citation

Wang, Shuo, et al. Dopant Diffusion‐Induced Dielectric Breakdown: Stacked Dielectric Reliability on Heavily Doped Polysilicon. Wiley-VCH.