Measuring error rates of mid-circuit measurements

Abstract High-fidelity mid-circuit measurements, which read out the state of specific qubits in a multiqubit processor without destroying them or disrupting their neighbors, are a critical component for useful quantum computing. They enable fault-tolerant quantum error correction, dynamic circuits,...

Full description

Saved in:
Bibliographic Details
Main Authors: Daniel Hothem, Jordan Hines, Charles Baldwin, Dan Gresh, Robin Blume-Kohout, Timothy Proctor
Format: Article
Language:English
Published: Nature Portfolio 2025-07-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-025-60923-x
Tags: Add Tag
No Tags, Be the first to tag this record!