Individual and interactive action mechanisms of mechanical, chemical, and electrical factors in Co polishing

With the continuous miniaturization of integrated circuit (IC) devices, Co is recognized as the most promising alternative to Cu as an interconnecting metal. During IC processing, Co surfaces need to be flattened. This work describes dynamic polishing experiments and static corrosion experiments on...

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Bibliographic Details
Main Authors: Fangjin Xie, Min Zhong, Wenhu Xu, Jianfeng Chen, Xiaobing Li, Meirong Yi
Format: Article
Language:English
Published: Tsinghua University Press 2025-06-01
Series:Friction
Subjects:
Online Access:https://www.sciopen.com/article/10.26599/FRICT.2025.9440961
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