Hall Effect and transient surface photovoltage (SPV) study of Cu3BiS3 thin films

Here, we present the electrical properties of the compound Cu3BiS3 deposited by co-evaporation. This new compound may have the properties necessary to be used as an absorbent layer in solar cells. The samples were characterized by Hall effect and transient surface photovoltage (SPV) measurements. Us...

Full description

Saved in:
Bibliographic Details
Main Authors: F. Mesa, A. Dussan, B. A. Paez-Sierra, H. Rodriguez-Hernandez
Format: Article
Language:English
Published: Pontificia Universidad Javeriana 2014-03-01
Series:Universitas Scientiarum
Subjects:
Online Access:http://revistas.javeriana.edu.co/index.php/scientarium/article/view/8388/7407
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Here, we present the electrical properties of the compound Cu3BiS3 deposited by co-evaporation. This new compound may have the properties necessary to be used as an absorbent layer in solar cells. The samples were characterized by Hall effect and transient surface photovoltage (SPV) measurements. Using Hall effect measurements, we found that the concentration of n charge carriers is in the order of 1016 cm-3 irrespective of the Cu/Bi mass ratio. We also found that the mobility of this compound (μ in the order of 4 cm2 V-1s-1) varies according to the transport mechanisms that govern it and are dependent on temperature. Based on the SPV, we found a high density of surface defects, which can be passivated by superimposing a buffer layer over the Cu3BiS3 compound.
ISSN:0122-7483
2027-1352