Getting Under the Sensor's Skin: The Importance of Electrical Contact Characterization for Conductive Composite Elastomers

Abstract Conductive elastomer composites can be used as flexible, lightweight, and inexpensive sensors, but they require ohmic electrical contacts to ensure readout consistency, and such contacts can suffer from hysteresis, non‐ohmic behavior, and cyclic fatigue. This work investigates a common caus...

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Main Authors: Claire C. Onsager, Lev Rovinsky, Can C. Aygen, Shira K. Cohen, Noa Lachman, Matthew A. Grayson
Format: Article
Language:English
Published: Wiley-VCH 2025-04-01
Series:Advanced Electronic Materials
Subjects:
Online Access:https://doi.org/10.1002/aelm.202400848
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author Claire C. Onsager
Lev Rovinsky
Can C. Aygen
Shira K. Cohen
Noa Lachman
Matthew A. Grayson
author_facet Claire C. Onsager
Lev Rovinsky
Can C. Aygen
Shira K. Cohen
Noa Lachman
Matthew A. Grayson
author_sort Claire C. Onsager
collection DOAJ
description Abstract Conductive elastomer composites can be used as flexible, lightweight, and inexpensive sensors, but they require ohmic electrical contacts to ensure readout consistency, and such contacts can suffer from hysteresis, non‐ohmic behavior, and cyclic fatigue. This work investigates a common cause of non‐ohmic conduction in such composite contacts, namely the thin insulating layer native to the surface of most silicone rubber composites that have been infused with multi‐walled carbon nanotubes for piezoresistive sensing. Voltage sweep dc measurements of individual contacts on this surface layer behave as parallel head‐to‐tail diodes with asymmetric hysteresis. Frequency sweep ac measurements quantify the insulator thickness with a leaky capacitor model to be ∼1 µm, independent of nanotube concentration, much thicker than the apparent layer thickness as imaged with scanning electron microscopy. This analysis also confirms highly anisotropic bulk conduction, circa 100 times higher in‐plane than cross‐plane. To remove the surface layer, a simple surface abrasion is shown to achieve deep ohmic electrical contact to the elastomer bulk. A three‐terminal method for verifying ohmic contacts is demonstrated and works even when all contacts are non‐ohmic. This three‐terminal method be easily applied to other conductive polymers for contact quality‐testing.
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spelling doaj-art-e072edc8a2eb4985a5cffe34284ea2ad2025-08-20T03:13:26ZengWiley-VCHAdvanced Electronic Materials2199-160X2025-04-01115n/an/a10.1002/aelm.202400848Getting Under the Sensor's Skin: The Importance of Electrical Contact Characterization for Conductive Composite ElastomersClaire C. Onsager0Lev Rovinsky1Can C. Aygen2Shira K. Cohen3Noa Lachman4Matthew A. Grayson5Department of Electrical and Computer Engineering Northwestern University Evanston 60208 USADepartment of Materials Science and Engineering Faculty of Engineering Tel Aviv University P.O. Box 39040 Tel Aviv 6997801 IsraelDepartment of Electrical and Computer Engineering Northwestern University Evanston 60208 USADepartment of Materials Science and Engineering Faculty of Engineering Tel Aviv University P.O. Box 39040 Tel Aviv 6997801 IsraelDepartment of Materials Science and Engineering Faculty of Engineering Tel Aviv University P.O. Box 39040 Tel Aviv 6997801 IsraelDepartment of Electrical and Computer Engineering Northwestern University Evanston 60208 USAAbstract Conductive elastomer composites can be used as flexible, lightweight, and inexpensive sensors, but they require ohmic electrical contacts to ensure readout consistency, and such contacts can suffer from hysteresis, non‐ohmic behavior, and cyclic fatigue. This work investigates a common cause of non‐ohmic conduction in such composite contacts, namely the thin insulating layer native to the surface of most silicone rubber composites that have been infused with multi‐walled carbon nanotubes for piezoresistive sensing. Voltage sweep dc measurements of individual contacts on this surface layer behave as parallel head‐to‐tail diodes with asymmetric hysteresis. Frequency sweep ac measurements quantify the insulator thickness with a leaky capacitor model to be ∼1 µm, independent of nanotube concentration, much thicker than the apparent layer thickness as imaged with scanning electron microscopy. This analysis also confirms highly anisotropic bulk conduction, circa 100 times higher in‐plane than cross‐plane. To remove the surface layer, a simple surface abrasion is shown to achieve deep ohmic electrical contact to the elastomer bulk. A three‐terminal method for verifying ohmic contacts is demonstrated and works even when all contacts are non‐ohmic. This three‐terminal method be easily applied to other conductive polymers for contact quality‐testing.https://doi.org/10.1002/aelm.202400848carbon nanotubesconductive compositeselastomerselectrical measurementinsulating surface layerohmic contacts
spellingShingle Claire C. Onsager
Lev Rovinsky
Can C. Aygen
Shira K. Cohen
Noa Lachman
Matthew A. Grayson
Getting Under the Sensor's Skin: The Importance of Electrical Contact Characterization for Conductive Composite Elastomers
Advanced Electronic Materials
carbon nanotubes
conductive composites
elastomers
electrical measurement
insulating surface layer
ohmic contacts
title Getting Under the Sensor's Skin: The Importance of Electrical Contact Characterization for Conductive Composite Elastomers
title_full Getting Under the Sensor's Skin: The Importance of Electrical Contact Characterization for Conductive Composite Elastomers
title_fullStr Getting Under the Sensor's Skin: The Importance of Electrical Contact Characterization for Conductive Composite Elastomers
title_full_unstemmed Getting Under the Sensor's Skin: The Importance of Electrical Contact Characterization for Conductive Composite Elastomers
title_short Getting Under the Sensor's Skin: The Importance of Electrical Contact Characterization for Conductive Composite Elastomers
title_sort getting under the sensor s skin the importance of electrical contact characterization for conductive composite elastomers
topic carbon nanotubes
conductive composites
elastomers
electrical measurement
insulating surface layer
ohmic contacts
url https://doi.org/10.1002/aelm.202400848
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