APA (7th ed.) Citation

Zhang, W., Li, Y., Xiao, W., Zhang, S., & Xiao, X. Identification of electrical breakdown faults in shunt capacitor bank elements using instantaneous negative sequence current. Elsevier.

Chicago Style (17th ed.) Citation

Zhang, Wenhai, Yuzhe Li, Wen Xiao, Shu Zhang, and Xianyong Xiao. Identification of Electrical Breakdown Faults in Shunt Capacitor Bank Elements Using Instantaneous Negative Sequence Current. Elsevier.

MLA (9th ed.) Citation

Zhang, Wenhai, et al. Identification of Electrical Breakdown Faults in Shunt Capacitor Bank Elements Using Instantaneous Negative Sequence Current. Elsevier.