SBT Approach towards Analog Electronic Circuit Fault Diagnosis
An approach for the fault diagnosis of single and multiple faults in linear analog electronic circuits is proposed in this paper. The simulation-before-test (SBT) diagnosis...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2007-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/2007/59856 |
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| Summary: | An approach for the fault diagnosis
of single and multiple faults in
linear analog electronic circuits is
proposed in this paper. The
simulation-before-test (SBT) diagnosis
approach proposed in this write up
basically consists of obtaining the
frequency response of fault
free/faulty circuit. The peak
frequency and the peak amplitude from
the error response are observed and
processed suitably to extract distinct
signatures for faulty and nonfaulty
conditions under maximum tolerance
conditions for other network
components. The artificial neural
network classifiers are then used for
the classification of fault. Networks
of reasonable dimensions are shown to
be capable of robust diagnosis of
analog circuits including effects due
to tolerances. This is a unique
contribution of this paper. Fault
computation time is drastically
reduced from the traditional analysis
techniques. This results in a direct
dollar savings at test time. A comparison of the proposed work with the previous works which also employ preprocessing techniques, reveals that our algorithm
performs significantly better in fault
diagnosis of analog circuits due to
our proposed preprocessing
techniques. |
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| ISSN: | 0882-7516 1563-5031 |