Quantitative Detection of the Contrast of Electron Microscopic Images of Amorphous Nanomaterials with the Complex Chemical Composition

Physically strict detection of the contrast of electron microscopic images of amorphous nanomaterials has been proposed. The necessity of separation of the contribution to the contrast of different types of electron scattering by sample atoms, namely, resilient coherent, resilient non-coherent, and...

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Bibliographic Details
Main Authors: M.Y. Bobyk, V.P. Ivanytskiy, V.S. Kovtunenko, O.Y. Svatyuk
Format: Article
Language:English
Published: Sumy State University 2012-06-01
Series:Журнал нано- та електронної фізики
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Online Access:http://jnep.sumdu.edu.ua/download/numbers/2012/2/articles/jnep_2012_V4_02041.pdf
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Summary:Physically strict detection of the contrast of electron microscopic images of amorphous nanomaterials has been proposed. The necessity of separation of the contribution to the contrast of different types of electron scattering by sample atoms, namely, resilient coherent, resilient non-coherent, and non- resilient, has been revealed. Simple analytical correlations for the determination of the contribution to the electron microscopic contrast of three different scattering types have been deduced.
ISSN:2077-6772