Kim, Y. Measurement and Analysis of Interconnects’ Resonance and Signal/Power Integrity Degradation in Glass Packages. MDPI AG.
Chicago Style (17th ed.) CitationKim, Youngwoo. Measurement and Analysis of Interconnects’ Resonance and Signal/Power Integrity Degradation in Glass Packages. MDPI AG.
MLA (9th ed.) CitationKim, Youngwoo. Measurement and Analysis of Interconnects’ Resonance and Signal/Power Integrity Degradation in Glass Packages. MDPI AG.
Warning: These citations may not always be 100% accurate.