Unusual Operation of the Junction Transistor Based on Dynamical Behavior of Impurities
The dynamical behavior of impurities into the silicon junction transistor has been studied using an empirical methodology to investigate its behavior knowing only the physical parameters of materials together with practical behavior of their passive components. The operating modes suggested with equ...
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Main Author: | |
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Format: | Article |
Language: | English |
Published: |
Wiley
2018-01-01
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Series: | Advances in Condensed Matter Physics |
Online Access: | http://dx.doi.org/10.1155/2018/4237686 |
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