MONITORING OF IC ENCAPSULATION PROCESS
High reliability of ASICs in metal-ceramic packages at the stage of manufacturing is achieved as a result of minimization of moisture content inside the package and due to continuous measurements of parameters of the encapsulation environment. It is shown that the use of instruments for checking the...
Saved in:
| Main Authors: | V. A. Saladukha, V. S. Turtsevitch, J. A. Solovjov, I. I. Rubtsevitch, A. F. Kerentsev, A. A. Dovzhenko, I. V. Chirko |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Belarusian National Technical University
2015-03-01
|
| Series: | Приборы и методы измерений |
| Subjects: | |
| Online Access: | https://pimi.bntu.by/jour/article/view/25 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Temperature Monitoring in PIC Surface
by: Sushma Pandey, et al.
Published: (2025-01-01) -
ARIA: Additive ReRAM-Based Integrity and Aging Monitoring for ICs
by: Thomas Schultz, et al.
Published: (2025-01-01) -
A semiconductor and IC teaching BOT for accurate knowledge democratization
by: Juan Andrés Lopez-Cubides, et al.
Published: (2024-06-01) -
Monitoring the technical condition of the rotor winding turbogenerator
by: M. V. Krickij, et al.
Published: (2017-12-01) -
Recent Developments in Thermal Management of 3D ICs: A Review
by: Fen Guo, et al.
Published: (2025-01-01)