APA (7th ed.) Citation

Jucheol, P., Gyeong, P. Y., Min-Ho, K., Myung-Keun, L., & Seop, H. M. Structural and Electrical Characterization of Hf0.5Zr0.5O2 Thin Films Crystallized by Rapid Thermal Annealing. EDP Sciences.

Chicago Style (17th ed.) Citation

Jucheol, Park, Park Yeong Gyeong, Kang Min-Ho, Lee Myung-Keun, and Hyun Moon Seop. Structural and Electrical Characterization of Hf0.5Zr0.5O2 Thin Films Crystallized by Rapid Thermal Annealing. EDP Sciences.

MLA (9th ed.) Citation

Jucheol, Park, et al. Structural and Electrical Characterization of Hf0.5Zr0.5O2 Thin Films Crystallized by Rapid Thermal Annealing. EDP Sciences.