Calculation of rf-induced temporal jitter in ultrafast electron diffraction

Calculation of rf-induced temporal jitter in ultrafast electron diffraction

A significant contribution to the temporal resolution of an ultrafast electron diffraction (UED) instrument is arrival time jitter caused by amplitude and phase variation of radio-frequency (rf) cavities. In this paper, we present a semianalytical approach for calculating rf-induced temporal jitter...

Full description

Saved in:
Bibliographic Details
Main Authors: T. Xu, F. Ji, C. J. R. Duncan, S. P. Weathersby, R. J. England
Format: Article
Language:English
Published: American Physical Society 2025-02-01
Series:Physical Review Accelerators and Beams
Online Access:http://doi.org/10.1103/PhysRevAccelBeams.28.024001
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items