Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy

Thin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measur...

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Main Authors: N. A. Davletkildeev, E. Yu. Mosur, D. V. Sokolov, I. A. Lobov
Format: Article
Language:English
Published: Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education 2020-11-01
Series:Омский научный вестник
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Online Access:https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2020/5%20(173)/94-98%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9C%D0%BE%D1%81%D1%83%D1%80%20%D0%95.%20%D0%AE.,%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.%20%D0%B8%20%D0%B4%D1%80..pdf
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author N. A. Davletkildeev
E. Yu. Mosur
D. V. Sokolov
I. A. Lobov
author_facet N. A. Davletkildeev
E. Yu. Mosur
D. V. Sokolov
I. A. Lobov
author_sort N. A. Davletkildeev
collection DOAJ
description Thin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measured by the method of conducting atomic force microscopy. By modeling the current-voltage characteristics using the Simmons model, the width of the potential barrier is determined, which for the investigated heterojunction is 0,5 nm.
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institution Kabale University
issn 1813-8225
2541-7541
language English
publishDate 2020-11-01
publisher Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education
record_format Article
series Омский научный вестник
spelling doaj-art-c5d0b95874a54797bec2996aa61d65a22025-02-02T18:26:44ZengOmsk State Technical University, Federal State Autonoumos Educational Institution of Higher EducationОмский научный вестник1813-82252541-75412020-11-015 (173)949810.25206/1813-8225-2020-173-94-98Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopyN. A. Davletkildeev0https://orcid.org/0000-0002-5591-6118E. Yu. Mosur1https://orcid.org/0000-0003-4890-0297D. V. Sokolov2https://orcid.org/0000-0002-8120-6638I. A. Lobov3https://orcid.org/0000-0003-2527-1715Omsk Scientific Center of Siberian Branch of Russian Academy of SciencesOmsk Scientific Center of Siberian Branch of Russian Academy of SciencesOmsk Scientific Center of Siberian Branch of Russian Academy of SciencesOmsk Scientific Center of Siberian Branch of Russian Academy of SciencesThin layers of polyaniline on the surface of highly oriented pyrolytic graphite are obtained by in-situ chemical oxidative polymerization of aniline. The current-voltage characteristics of the tip/polyaniline/graphite contact, which have a form characteristic of tunnel contacts, have been measured by the method of conducting atomic force microscopy. By modeling the current-voltage characteristics using the Simmons model, the width of the potential barrier is determined, which for the investigated heterojunction is 0,5 nm.https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2020/5%20(173)/94-98%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9C%D0%BE%D1%81%D1%83%D1%80%20%D0%95.%20%D0%AE.,%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.%20%D0%B8%20%D0%B4%D1%80..pdfpolyanilinegraphiteheterojunctionconductive atomic force microscopypotential barrier width
spellingShingle N. A. Davletkildeev
E. Yu. Mosur
D. V. Sokolov
I. A. Lobov
Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy
Омский научный вестник
polyaniline
graphite
heterojunction
conductive atomic force microscopy
potential barrier width
title Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy
title_full Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy
title_fullStr Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy
title_full_unstemmed Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy
title_short Study of the charge transfer process in the polyaniline/graphite heterojunction by conductive atomic force microscopy
title_sort study of the charge transfer process in the polyaniline graphite heterojunction by conductive atomic force microscopy
topic polyaniline
graphite
heterojunction
conductive atomic force microscopy
potential barrier width
url https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2020/5%20(173)/94-98%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9C%D0%BE%D1%81%D1%83%D1%80%20%D0%95.%20%D0%AE.,%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.%20%D0%B8%20%D0%B4%D1%80..pdf
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AT eyumosur studyofthechargetransferprocessinthepolyanilinegraphiteheterojunctionbyconductiveatomicforcemicroscopy
AT dvsokolov studyofthechargetransferprocessinthepolyanilinegraphiteheterojunctionbyconductiveatomicforcemicroscopy
AT ialobov studyofthechargetransferprocessinthepolyanilinegraphiteheterojunctionbyconductiveatomicforcemicroscopy