Material Sensing with Spatial and Spectral Resolution Based on an Integrated Near-Infrared Spectral Sensor and a CMOS Camera

Material Sensing with Spatial and Spectral Resolution Based on an Integrated Near-Infrared Spectral Sensor and a CMOS Camera

Measuring the composition of materials at a distance is a key requirement in industrial process monitoring, recycling, precision agriculture, and environmental monitoring. Spectral imaging in the visible or near-infrared (NIR) spectral bands provides a potential solution by combining spatial and spe...

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Bibliographic Details
Main Authors: Ben Delaney, Sjors Buntinx, Don M. J. van Elst, Anne van Klinken, René P. J. van Veldhoven, Andrea Fiore
Format: Article
Language:English
Published: MDPI AG 2025-05-01
Series:Sensors
Subjects:
spectral sensing
material classification
near infrared
integrated photonics
Online Access:https://www.mdpi.com/1424-8220/25/11/3295
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