Femtosecond X-ray cross-correlation analysis of disordered crystals forming in a supercooled atomic liquid

Femtosecond X-ray cross-correlation analysis of disordered crystals forming in a supercooled atomic liquid

We demonstrate an advanced scattering method for accessing the 3D reciprocal space of crystalline structures forming in a rapidly supercooled noble-gas liquid using a combination of femtosecond X-ray diffraction and X-ray cross-correlation analysis. The preservation of angular information from the s...

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Main Authors: Johannes Möller, Michele Caresana, Alexander Schottelius, Felix Lehmkühler, Ulrike Boesenberg, Frédéric Caupin, Francesco Dallari, Tiberio A. Ezquerra, José M. Fernández, Luca Gelisio, Claudia Goy, Jörg Hallmann, Anton Kalinin, Chan Kim, Ruslan P. Kurta, Dmitry Lapkin, Francesco Mambretti, Markus Scholz, Roman Shayduk, René Steinbrügge, Florian Trinter, Ivan A. Vartanyants, Alexey Zozulya, Davide E. Galli, Gerhard Grübel, Anders Madsen, Robert E. Grisenti
Format: Article
Language:English
Published: International Union of Crystallography 2025-07-01
Series:IUCrJ
Subjects:
femtosecond studies
nanocrystals
correlated fluctuations
diffract-then-destroy
dynamical studies
time-resolved studies
x-ray free-electron lasers
xfels
Online Access:https://journals.iucr.org/paper?S2052252525004063
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Summary:We demonstrate an advanced scattering method for accessing the 3D reciprocal space of crystalline structures forming in a rapidly supercooled noble-gas liquid using a combination of femtosecond X-ray diffraction and X-ray cross-correlation analysis. The preservation of angular information from the scattering signal allows probing the structure factor along selected directions in reciprocal space and identifying signatures undetectable in azimuthally integrated scattering curves. Therefore, more information from serial diffraction experiments on stochastic crystallization processes can be retrieved despite the inherent variation of the crystal orientation and morphology for each single probe. We also demonstrate how different features in the correlation maps can be associated with certain forms of stacking faults, which enables studying such defects in situ and disentangling them from simultaneous changes in crystal size and temperature.
ISSN:2052-2525

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