APA (7th ed.) Citation

Bendada, E., Raïs, K., Mialhe, P., & Charles, J. P. Surface Recombination Via Interface Defects in Field Effect Transistors. Wiley.

Chicago Style (17th ed.) Citation

Bendada, E., K. Raïs, P. Mialhe, and J. P. Charles. Surface Recombination Via Interface Defects in Field Effect Transistors. Wiley.

MLA (9th ed.) Citation

Bendada, E., et al. Surface Recombination Via Interface Defects in Field Effect Transistors. Wiley.