APA (7th ed.) Citation

Zhang, X. Characterization of Layer Number of Two-Dimensional Transition Metal Diselenide Semiconducting Devices Using Si-Peak Analysis. Wiley.

Chicago Style (17th ed.) Citation

Zhang, Xian. Characterization of Layer Number of Two-Dimensional Transition Metal Diselenide Semiconducting Devices Using Si-Peak Analysis. Wiley.

MLA (9th ed.) Citation

Zhang, Xian. Characterization of Layer Number of Two-Dimensional Transition Metal Diselenide Semiconducting Devices Using Si-Peak Analysis. Wiley.

Warning: These citations may not always be 100% accurate.