Costa, F. J. d., Zeinati, A., Trevisoli, R., Misra, D., & Doria, R. T. Experimental Comparison of HfO<sub>2/X</sub>-Based ReRAM Devices Switching Properties by the MIM Capacitance. IEEE.
Chicago Style (17th ed.) CitationCosta, Fernando Jose da, Aseel Zeinati, Renan Trevisoli, Durga Misra, and Rodrigo Trevisoli Doria. Experimental Comparison of HfO<sub>2/X</sub>-Based ReRAM Devices Switching Properties by the MIM Capacitance. IEEE.
MLA (9th ed.) CitationCosta, Fernando Jose da, et al. Experimental Comparison of HfO<sub>2/X</sub>-Based ReRAM Devices Switching Properties by the MIM Capacitance. IEEE.
Warning: These citations may not always be 100% accurate.