GaN Nanopowder synthesis via nitridation: Fabrication and characterization of GaN thin Films for UV detection applications

This study presents a novel method for synthesizing gallium nitride nanoparticles via nitridation and their subsequent deposition onto silicon substrates using electron beam evaporation for UV detection applications. The structural and optical properties of the resulting gallium nitride thin films w...

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Main Authors: Mahdi Hajimazdarani, Peyman Yaghoubizadeh, Ali Jafari, Ali Kenarsari Moghadam, Mojtaba Hajimazdarani, Mohammad Javad Eshraghi
Format: Article
Language:English
Published: KeAi Communications Co., Ltd. 2025-01-01
Series:Sensors International
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Online Access:http://www.sciencedirect.com/science/article/pii/S266635112500004X
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author Mahdi Hajimazdarani
Peyman Yaghoubizadeh
Ali Jafari
Ali Kenarsari Moghadam
Mojtaba Hajimazdarani
Mohammad Javad Eshraghi
author_facet Mahdi Hajimazdarani
Peyman Yaghoubizadeh
Ali Jafari
Ali Kenarsari Moghadam
Mojtaba Hajimazdarani
Mohammad Javad Eshraghi
author_sort Mahdi Hajimazdarani
collection DOAJ
description This study presents a novel method for synthesizing gallium nitride nanoparticles via nitridation and their subsequent deposition onto silicon substrates using electron beam evaporation for UV detection applications. The structural and optical properties of the resulting gallium nitride thin films were thoroughly characterized. X-ray diffraction confirmed that the synthesized powder has a wurtzite crystal structure, while the deposited thin film has an amorphous structure. Field emission scanning electron microscopy revealed a uniform layer with an approximate thickness of 150 nm. Energy dispersive spectroscopy confirmed that the stoichiometric ratio of gallium to nitrogen was maintained throughout the coating process. Additionally, ultraviolet diffuse reflectance spectroscopy measurements revealed a bandgap of 3.37 eV for the deposited thin film. Additionally, gold electrodes were deposited on the gallium nitride thin film, and the optical sensor's detection properties were evaluated, demonstrating a sensitivity of 133.6 along with rise and fall times of 18 ms and 15 ms, respectively. These findings underscore the potential of gallium nitride-based materials for advanced optical sensor applications in various fields.
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institution Kabale University
issn 2666-3511
language English
publishDate 2025-01-01
publisher KeAi Communications Co., Ltd.
record_format Article
series Sensors International
spelling doaj-art-c0c6ca941d67450bac603027ff3bc4b42025-01-22T05:44:07ZengKeAi Communications Co., Ltd.Sensors International2666-35112025-01-016100329GaN Nanopowder synthesis via nitridation: Fabrication and characterization of GaN thin Films for UV detection applicationsMahdi Hajimazdarani0Peyman Yaghoubizadeh1Ali Jafari2Ali Kenarsari Moghadam3Mojtaba Hajimazdarani4Mohammad Javad Eshraghi5Nano-Electronics and Thin Film Lab., Department of Electrical and Computer Engineering, University of Tehran, Tehran, IranDepartment of Semiconductors, Materials and Energy Research Center, Karaj, IranFaculty of Electrical and Computer Engineering, University of Tabriz, Tabriz, IranDepartment of Semiconductors, Materials and Energy Research Center, Karaj, IranFaculty of Electrical Engineering and Medical Engineering, Islamic Azad University East Tehran Branch, Tehran, IranDepartment of Semiconductors, Materials and Energy Research Center, Karaj, Iran; Corresponding author.This study presents a novel method for synthesizing gallium nitride nanoparticles via nitridation and their subsequent deposition onto silicon substrates using electron beam evaporation for UV detection applications. The structural and optical properties of the resulting gallium nitride thin films were thoroughly characterized. X-ray diffraction confirmed that the synthesized powder has a wurtzite crystal structure, while the deposited thin film has an amorphous structure. Field emission scanning electron microscopy revealed a uniform layer with an approximate thickness of 150 nm. Energy dispersive spectroscopy confirmed that the stoichiometric ratio of gallium to nitrogen was maintained throughout the coating process. Additionally, ultraviolet diffuse reflectance spectroscopy measurements revealed a bandgap of 3.37 eV for the deposited thin film. Additionally, gold electrodes were deposited on the gallium nitride thin film, and the optical sensor's detection properties were evaluated, demonstrating a sensitivity of 133.6 along with rise and fall times of 18 ms and 15 ms, respectively. These findings underscore the potential of gallium nitride-based materials for advanced optical sensor applications in various fields.http://www.sciencedirect.com/science/article/pii/S266635112500004XGallium nitrideThin filmElectron beam depositionPhotodetectorNitridation
spellingShingle Mahdi Hajimazdarani
Peyman Yaghoubizadeh
Ali Jafari
Ali Kenarsari Moghadam
Mojtaba Hajimazdarani
Mohammad Javad Eshraghi
GaN Nanopowder synthesis via nitridation: Fabrication and characterization of GaN thin Films for UV detection applications
Sensors International
Gallium nitride
Thin film
Electron beam deposition
Photodetector
Nitridation
title GaN Nanopowder synthesis via nitridation: Fabrication and characterization of GaN thin Films for UV detection applications
title_full GaN Nanopowder synthesis via nitridation: Fabrication and characterization of GaN thin Films for UV detection applications
title_fullStr GaN Nanopowder synthesis via nitridation: Fabrication and characterization of GaN thin Films for UV detection applications
title_full_unstemmed GaN Nanopowder synthesis via nitridation: Fabrication and characterization of GaN thin Films for UV detection applications
title_short GaN Nanopowder synthesis via nitridation: Fabrication and characterization of GaN thin Films for UV detection applications
title_sort gan nanopowder synthesis via nitridation fabrication and characterization of gan thin films for uv detection applications
topic Gallium nitride
Thin film
Electron beam deposition
Photodetector
Nitridation
url http://www.sciencedirect.com/science/article/pii/S266635112500004X
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