Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit

Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit

Abstract Single‐event transients (SETs) due to heavy‐ion (HI) strikes adversely affect the electronic circuits in the sub‐100 nm regime in the radiation environment. This study proposes techniques to mitigate SETs in CMOS voltage‐controlled oscillators (VCOs) without affecting the circuit specificat...

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Bibliographic Details
Main Authors: Arumugam Karthigeyan, Sankararajan Radha, Esakkimuthu Manikandan
Format: Article
Language:English
Published: Wiley 2022-03-01
Series:IET Circuits, Devices and Systems
Subjects:
radiation hardening (electronics)
voltage‐controlled oscillators
Online Access:https://doi.org/10.1049/cds2.12094
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