Growth of Surface Micro- and Nanostructures During Depth Profiling of PbTe Crystals by Ar Plasma

Peculiarities of depth profiling of PbTe crystals by Ar plasma with energy of 350 eV at the conditions of Secondary Neutral Mass Spectrometry originated from the crystal growth environment are presented. The crystals grown from vapor phase and from melt by the Bridgman method were studied. The natur...

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Bibliographic Details
Main Authors: D.M. Zayachuk, V.E. Slynko, A. Csik
Format: Article
Language:English
Published: Sumy State University 2017-10-01
Series:Журнал нано- та електронної фізики
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Online Access:http://jnep.sumdu.edu.ua:8080/download/numbers/2017/5/articles/Proof_JNEP_05034.pdf
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