Deterioration of Li-doped phenanthroline-based charge generation layer for tandem organic light-emitting diodes
Understanding the deterioration of the charge generation layer (CGL) is an uprising issue for efficient and stable tandem organic light-emitting diodes. Here, we comprehensively investigated the change in the electrical characteristics of Li-doped CGLs according to different stress conditions and co...
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Taylor & Francis Group
2025-01-01
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| Series: | Journal of Information Display |
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| Online Access: | https://www.tandfonline.com/doi/10.1080/15980316.2024.2356848 |
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| author | Ki Ju Kim Sunwoo Kang Taekyung Kim |
| author_facet | Ki Ju Kim Sunwoo Kang Taekyung Kim |
| author_sort | Ki Ju Kim |
| collection | DOAJ |
| description | Understanding the deterioration of the charge generation layer (CGL) is an uprising issue for efficient and stable tandem organic light-emitting diodes. Here, we comprehensively investigated the change in the electrical characteristics of Li-doped CGLs according to different stress conditions and compared the stability of Li diffusion in two phenanthroline-based electron transport materials. Through current density–voltage and capacitance-frequency measurements, it was revealed that electrical stress and thermal stress affect CGL’s electrical properties differently. Moreover, the exponential trap distribution model analysis informed that the Li diffusion is expedited toward narrowing depletion width in the CGL. Diffusion of Li and thermal effect to the diffusion was experimentally observed by X-ray photoelectron spectroscopy (XPS) depth profiling. We also evaluated variations in the operating voltage of tandem devices that differed only in nCGL. Overall, Li diffusion occurs more favorably in sparse Bphen film with weak binding energy rather than closely packed BPPB film with strong binding energy, which highlights that atomic geometry and morphological characteristics are crucial for the stability of tandem devices. |
| format | Article |
| id | doaj-art-bca876c833ae4ae7a5a492d1bde3445e |
| institution | Kabale University |
| issn | 1598-0316 2158-1606 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | Taylor & Francis Group |
| record_format | Article |
| series | Journal of Information Display |
| spelling | doaj-art-bca876c833ae4ae7a5a492d1bde3445e2025-01-18T14:43:36ZengTaylor & Francis GroupJournal of Information Display1598-03162158-16062025-01-0126191810.1080/15980316.2024.2356848Deterioration of Li-doped phenanthroline-based charge generation layer for tandem organic light-emitting diodesKi Ju Kim0Sunwoo Kang1Taekyung Kim2Department of Information Display, Hongik University, Seoul, Republic of KoreaDepartment of Chemistry, Dankook University, Cheonan, Chungnam 448-701, Republic of KoreaDepartment of Information Display, Hongik University, Seoul, Republic of KoreaUnderstanding the deterioration of the charge generation layer (CGL) is an uprising issue for efficient and stable tandem organic light-emitting diodes. Here, we comprehensively investigated the change in the electrical characteristics of Li-doped CGLs according to different stress conditions and compared the stability of Li diffusion in two phenanthroline-based electron transport materials. Through current density–voltage and capacitance-frequency measurements, it was revealed that electrical stress and thermal stress affect CGL’s electrical properties differently. Moreover, the exponential trap distribution model analysis informed that the Li diffusion is expedited toward narrowing depletion width in the CGL. Diffusion of Li and thermal effect to the diffusion was experimentally observed by X-ray photoelectron spectroscopy (XPS) depth profiling. We also evaluated variations in the operating voltage of tandem devices that differed only in nCGL. Overall, Li diffusion occurs more favorably in sparse Bphen film with weak binding energy rather than closely packed BPPB film with strong binding energy, which highlights that atomic geometry and morphological characteristics are crucial for the stability of tandem devices.https://www.tandfonline.com/doi/10.1080/15980316.2024.2356848Charge generation layerdegradationLi diffusiontandem OLEDs |
| spellingShingle | Ki Ju Kim Sunwoo Kang Taekyung Kim Deterioration of Li-doped phenanthroline-based charge generation layer for tandem organic light-emitting diodes Journal of Information Display Charge generation layer degradation Li diffusion tandem OLEDs |
| title | Deterioration of Li-doped phenanthroline-based charge generation layer for tandem organic light-emitting diodes |
| title_full | Deterioration of Li-doped phenanthroline-based charge generation layer for tandem organic light-emitting diodes |
| title_fullStr | Deterioration of Li-doped phenanthroline-based charge generation layer for tandem organic light-emitting diodes |
| title_full_unstemmed | Deterioration of Li-doped phenanthroline-based charge generation layer for tandem organic light-emitting diodes |
| title_short | Deterioration of Li-doped phenanthroline-based charge generation layer for tandem organic light-emitting diodes |
| title_sort | deterioration of li doped phenanthroline based charge generation layer for tandem organic light emitting diodes |
| topic | Charge generation layer degradation Li diffusion tandem OLEDs |
| url | https://www.tandfonline.com/doi/10.1080/15980316.2024.2356848 |
| work_keys_str_mv | AT kijukim deteriorationoflidopedphenanthrolinebasedchargegenerationlayerfortandemorganiclightemittingdiodes AT sunwookang deteriorationoflidopedphenanthrolinebasedchargegenerationlayerfortandemorganiclightemittingdiodes AT taekyungkim deteriorationoflidopedphenanthrolinebasedchargegenerationlayerfortandemorganiclightemittingdiodes |