High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package Modules
This article discusses challenges and methods for production-level over-the-air (OTA) test of antenna-in-package (AiP) modules comprising antenna arrays operating at millimeter-wave frequencies. Starting with the requirements of testing specific properties of AiP modules, characteristics of far-fiel...
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| Format: | Article |
| Language: | English |
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IEEE
2025-01-01
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| Series: | IEEE Open Journal of Instrumentation and Measurement |
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| Online Access: | https://ieeexplore.ieee.org/document/10835189/ |
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| author | Jose Moreira Athanasios Papanikolaou Jan Hesselbarth |
| author_facet | Jose Moreira Athanasios Papanikolaou Jan Hesselbarth |
| author_sort | Jose Moreira |
| collection | DOAJ |
| description | This article discusses challenges and methods for production-level over-the-air (OTA) test of antenna-in-package (AiP) modules comprising antenna arrays operating at millimeter-wave frequencies. Starting with the requirements of testing specific properties of AiP modules, characteristics of far-field tests as well as different kinds of near-field tests are presented. Considering the constraints of typical automatic test equipment (ATE) used by the semiconductor industry, this article describes technical solutions for the integration of OTA testing into the ATE environment. Practical examples are discussed for testing AiP modules for 5G communication (frequency bands from 24 to 53 GHz). Limitations of the proposed techniques are detailed, and in view of future requirements for testing larger arrays at higher frequency, novel scalable approaches are presented for probing in the reactive near-field of the antenna array radiators. |
| format | Article |
| id | doaj-art-bbba3f81e6854eaabd3b4f37c1b28f0a |
| institution | Kabale University |
| issn | 2768-7236 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Open Journal of Instrumentation and Measurement |
| spelling | doaj-art-bbba3f81e6854eaabd3b4f37c1b28f0a2025-01-31T00:02:18ZengIEEEIEEE Open Journal of Instrumentation and Measurement2768-72362025-01-01411510.1109/OJIM.2025.352752910835189High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package ModulesJose Moreira0https://orcid.org/0000-0003-2574-0665Athanasios Papanikolaou1https://orcid.org/0009-0002-1814-550XJan Hesselbarth2https://orcid.org/0000-0002-4905-8591Department of HW R&D, Advantest, Böblingen, GermanyDepartment of IHF, University of Stuttgart, Stuttgart, GermanyDepartment of IHF, University of Stuttgart, Stuttgart, GermanyThis article discusses challenges and methods for production-level over-the-air (OTA) test of antenna-in-package (AiP) modules comprising antenna arrays operating at millimeter-wave frequencies. Starting with the requirements of testing specific properties of AiP modules, characteristics of far-field tests as well as different kinds of near-field tests are presented. Considering the constraints of typical automatic test equipment (ATE) used by the semiconductor industry, this article describes technical solutions for the integration of OTA testing into the ATE environment. Practical examples are discussed for testing AiP modules for 5G communication (frequency bands from 24 to 53 GHz). Limitations of the proposed techniques are detailed, and in view of future requirements for testing larger arrays at higher frequency, novel scalable approaches are presented for probing in the reactive near-field of the antenna array radiators.https://ieeexplore.ieee.org/document/10835189/Antenna arrayantenna array measurementantenna array testantenna in package (AiP)antenna near-fieldmillimeter waves (mm-waves) |
| spellingShingle | Jose Moreira Athanasios Papanikolaou Jan Hesselbarth High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package Modules IEEE Open Journal of Instrumentation and Measurement Antenna array antenna array measurement antenna array test antenna in package (AiP) antenna near-field millimeter waves (mm-waves) |
| title | High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package Modules |
| title_full | High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package Modules |
| title_fullStr | High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package Modules |
| title_full_unstemmed | High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package Modules |
| title_short | High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package Modules |
| title_sort | high volume ota production testing of millimeter wave antenna in package modules |
| topic | Antenna array antenna array measurement antenna array test antenna in package (AiP) antenna near-field millimeter waves (mm-waves) |
| url | https://ieeexplore.ieee.org/document/10835189/ |
| work_keys_str_mv | AT josemoreira highvolumeotaproductiontestingofmillimeterwaveantennainpackagemodules AT athanasiospapanikolaou highvolumeotaproductiontestingofmillimeterwaveantennainpackagemodules AT janhesselbarth highvolumeotaproductiontestingofmillimeterwaveantennainpackagemodules |