Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M.
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| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1977-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/APEC.4.85 |
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| _version_ | 1832561112296456192 |
|---|---|
| author | D. J. Pedder |
| author_facet | D. J. Pedder |
| author_sort | D. J. Pedder |
| collection | DOAJ |
| format | Article |
| id | doaj-art-bb01e6a7fd9949f5a61d458d3bb4425c |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1977-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-bb01e6a7fd9949f5a61d458d3bb4425c2025-02-03T01:26:00ZengWileyActive and Passive Electronic Components0882-75161563-50311977-01-0142858810.1155/APEC.4.85Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M.D. J. Pedderhttp://dx.doi.org/10.1155/APEC.4.85 |
| spellingShingle | D. J. Pedder Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M. Active and Passive Electronic Components |
| title | Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M. |
| title_full | Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M. |
| title_fullStr | Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M. |
| title_full_unstemmed | Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M. |
| title_short | Techniques for the Examination of Thick Film Resistor Microstructures by T.E.M. |
| title_sort | techniques for the examination of thick film resistor microstructures by t e m |
| url | http://dx.doi.org/10.1155/APEC.4.85 |
| work_keys_str_mv | AT djpedder techniquesfortheexaminationofthickfilmresistormicrostructuresbytem |