Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices
Additive Manufacturing (AM), as a revolutionary breakthrough in advanced manufacturing paradigms, leverages its unique layer-by-layer construction advantage to exhibit significant technological superiority in the fabrication of complex structural components for aerospace, biomedical, and other field...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-05-01
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| Series: | Nanomaterials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-4991/15/11/821 |
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