Shukla, S., Gill, S. S., Kaur, N., Jatana, H. S., & Nehru, V. Comparative Simulation Analysis of Process Parameter Variations in 20 nm Triangular FinFET. Wiley.
Chicago Style (17th ed.) CitationShukla, Satyam, Sandeep Singh Gill, Navneet Kaur, H. S. Jatana, and Varun Nehru. Comparative Simulation Analysis of Process Parameter Variations in 20 nm Triangular FinFET. Wiley.
MLA (9th ed.) CitationShukla, Satyam, et al. Comparative Simulation Analysis of Process Parameter Variations in 20 nm Triangular FinFET. Wiley.
Warning: These citations may not always be 100% accurate.