TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS
Construction techniques of precision measuring instruments of optical characteristics on the basis of two-wave lasers with use of basic and nephelometer methods are presented. System stability to changes of hardware constants, influence of an environment, pollution of optics is shown. The system aut...
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| Format: | Article |
| Language: | English |
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Belarusian National Technical University
2015-04-01
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| Series: | Приборы и методы измерений |
| Subjects: | |
| Online Access: | https://pimi.bntu.by/jour/article/view/132 |
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| author | V. L. Kozlov M. M. Kygeiko |
| author_facet | V. L. Kozlov M. M. Kygeiko |
| author_sort | V. L. Kozlov |
| collection | DOAJ |
| description | Construction techniques of precision measuring instruments of optical characteristics on the basis of two-wave lasers with use of basic and nephelometer methods are presented. System stability to changes of hardware constants, influence of an environment, pollution of optics is shown. The system automatically takes into account changes of a controllable line length that expands functionalities of a measuring instrument. |
| format | Article |
| id | doaj-art-b8822825d3204dcaaf47554fc9b434bd |
| institution | Kabale University |
| issn | 2220-9506 2414-0473 |
| language | English |
| publishDate | 2015-04-01 |
| publisher | Belarusian National Technical University |
| record_format | Article |
| series | Приборы и методы измерений |
| spelling | doaj-art-b8822825d3204dcaaf47554fc9b434bd2025-02-03T05:16:53ZengBelarusian National Technical UniversityПриборы и методы измерений2220-95062414-04732015-04-010251210.21122/2220-9506-2011-0-2-46-52126TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERSV. L. Kozlov0M. M. Kygeiko1Белорусский государственный университетБелорусский государственный университетConstruction techniques of precision measuring instruments of optical characteristics on the basis of two-wave lasers with use of basic and nephelometer methods are presented. System stability to changes of hardware constants, influence of an environment, pollution of optics is shown. The system automatically takes into account changes of a controllable line length that expands functionalities of a measuring instrument.https://pimi.bntu.by/jour/article/view/132two-wavelength semiconductor laseroptical characteristics measuring instrumentbasic and nephelometer methods |
| spellingShingle | V. L. Kozlov M. M. Kygeiko TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS Приборы и методы измерений two-wavelength semiconductor laser optical characteristics measuring instrument basic and nephelometer methods |
| title | TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS |
| title_full | TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS |
| title_fullStr | TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS |
| title_full_unstemmed | TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS |
| title_short | TRANSPARENCY METERS AND GAS ANALYZERS BASED ON TWO-WAVELENGTH SEMICONDUCTOR LASERS |
| title_sort | transparency meters and gas analyzers based on two wavelength semiconductor lasers |
| topic | two-wavelength semiconductor laser optical characteristics measuring instrument basic and nephelometer methods |
| url | https://pimi.bntu.by/jour/article/view/132 |
| work_keys_str_mv | AT vlkozlov transparencymetersandgasanalyzersbasedontwowavelengthsemiconductorlasers AT mmkygeiko transparencymetersandgasanalyzersbasedontwowavelengthsemiconductorlasers |