Modeling of Memristive and Memcapacitive Behaviors in Metal-Oxide Junctions
Memristive behavior has been clearly addressed through growth and shrinkage of thin filaments in metal-oxide junctions. Capacitance change has also been observed, raising the possibility of using them as memcapacitors. Therefore, this paper proves that metal-oxide junctions can behave as a memcapaci...
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| Format: | Article |
| Language: | English |
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Wiley
2015-01-01
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| Series: | The Scientific World Journal |
| Online Access: | http://dx.doi.org/10.1155/2015/910126 |
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| author | M. G. A. Mohamed HyungWon Kim Tae-Won Cho |
| author_facet | M. G. A. Mohamed HyungWon Kim Tae-Won Cho |
| author_sort | M. G. A. Mohamed |
| collection | DOAJ |
| description | Memristive behavior has been clearly addressed through growth and shrinkage of thin filaments in metal-oxide junctions. Capacitance change has also been observed, raising the possibility of using them as memcapacitors. Therefore, this paper proves that metal-oxide junctions can behave as a memcapacitor element by analyzing its characteristics and modeling its memristive and memcapacitive behaviors. We develop two behavioral modeling techniques: charge-dependent memcapacitor model and voltage-dependent memcapacitor model. A new physical model for metal-oxide junctions is presented based on conducting filaments variations, and its effect on device capacitance and resistance. In this model, we apply the exponential nature of growth and shrinkage of thin filaments and use Simmons’ tunneling equation to calculate the tunneling current. Simulation results show how the variations of practical device parameters can change the device behavior. They clarify the basic conditions for building a memcapacitor device with negligible change in resistance. |
| format | Article |
| id | doaj-art-b73bed25b9714cf682f7f64908e58ae9 |
| institution | Kabale University |
| issn | 2356-6140 1537-744X |
| language | English |
| publishDate | 2015-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | The Scientific World Journal |
| spelling | doaj-art-b73bed25b9714cf682f7f64908e58ae92025-02-03T06:14:00ZengWileyThe Scientific World Journal2356-61401537-744X2015-01-01201510.1155/2015/910126910126Modeling of Memristive and Memcapacitive Behaviors in Metal-Oxide JunctionsM. G. A. Mohamed0HyungWon Kim1Tae-Won Cho2Electronic Engineering Department, Chungbuk National University, Cheongju 361-763, Republic of KoreaElectronic Engineering Department, Chungbuk National University, Cheongju 361-763, Republic of KoreaElectronic Engineering Department, Chungbuk National University, Cheongju 361-763, Republic of KoreaMemristive behavior has been clearly addressed through growth and shrinkage of thin filaments in metal-oxide junctions. Capacitance change has also been observed, raising the possibility of using them as memcapacitors. Therefore, this paper proves that metal-oxide junctions can behave as a memcapacitor element by analyzing its characteristics and modeling its memristive and memcapacitive behaviors. We develop two behavioral modeling techniques: charge-dependent memcapacitor model and voltage-dependent memcapacitor model. A new physical model for metal-oxide junctions is presented based on conducting filaments variations, and its effect on device capacitance and resistance. In this model, we apply the exponential nature of growth and shrinkage of thin filaments and use Simmons’ tunneling equation to calculate the tunneling current. Simulation results show how the variations of practical device parameters can change the device behavior. They clarify the basic conditions for building a memcapacitor device with negligible change in resistance.http://dx.doi.org/10.1155/2015/910126 |
| spellingShingle | M. G. A. Mohamed HyungWon Kim Tae-Won Cho Modeling of Memristive and Memcapacitive Behaviors in Metal-Oxide Junctions The Scientific World Journal |
| title | Modeling of Memristive and Memcapacitive Behaviors in Metal-Oxide Junctions |
| title_full | Modeling of Memristive and Memcapacitive Behaviors in Metal-Oxide Junctions |
| title_fullStr | Modeling of Memristive and Memcapacitive Behaviors in Metal-Oxide Junctions |
| title_full_unstemmed | Modeling of Memristive and Memcapacitive Behaviors in Metal-Oxide Junctions |
| title_short | Modeling of Memristive and Memcapacitive Behaviors in Metal-Oxide Junctions |
| title_sort | modeling of memristive and memcapacitive behaviors in metal oxide junctions |
| url | http://dx.doi.org/10.1155/2015/910126 |
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