Recycled integrated circuit detection using reliability analysis and machine learning algorithms
Abstract The use of counterfeit integrated circuits (ICs) in electronic products decreases its quality and lifetime. Recycled ICs can be detected by the method of aging analysis. Aging is carried out through reliability analysis with the effect of hot carrier injection and bias temperature instabili...
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| Format: | Article |
| Language: | English |
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Wiley
2021-01-01
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| Series: | IET Computers & Digital Techniques |
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| Online Access: | https://doi.org/10.1049/cdt2.12005 |
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| author | Udaya Shankar Santhana Krishnan Kalpana Palanisamy |
| author_facet | Udaya Shankar Santhana Krishnan Kalpana Palanisamy |
| author_sort | Udaya Shankar Santhana Krishnan |
| collection | DOAJ |
| description | Abstract The use of counterfeit integrated circuits (ICs) in electronic products decreases its quality and lifetime. Recycled ICs can be detected by the method of aging analysis. Aging is carried out through reliability analysis with the effect of hot carrier injection and bias temperature instability (BTI). In this work, three machine learning methods, namely K‐means clustering, back propagation neural network (BPNN) and support vector machines (SVMs), are used to detect the recycled IC aged for a shorter period (1 day) with minimum data size. This work also distinguishes the effects of degradation due to process variations and reliability effects. The reliability and Monte Carlo simulation are performed on benchmark circuits such as c17, s27, b02 and fully differential folded‐cascode amplifier using the Cadence Virtuoso tool, and the parameters such as minimum voltage, delay value, supply current, gain, phase margin and bandwidth are measured. Machine learning methods are developed using MATLAB to train and classify the parameters. From the results obtained, it is observed that the classification rate for the benchmark circuits is 100%, and using BPNN, K‐means clustering and SVM and the proposed method, recycled IC or used IC is detected even if it was used for 1 day. |
| format | Article |
| id | doaj-art-b68c0ec3f79f4426b0c6acd73020ef89 |
| institution | Kabale University |
| issn | 1751-8601 1751-861X |
| language | English |
| publishDate | 2021-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | IET Computers & Digital Techniques |
| spelling | doaj-art-b68c0ec3f79f4426b0c6acd73020ef892025-02-03T01:29:37ZengWileyIET Computers & Digital Techniques1751-86011751-861X2021-01-01151203510.1049/cdt2.12005Recycled integrated circuit detection using reliability analysis and machine learning algorithmsUdaya Shankar Santhana Krishnan0Kalpana Palanisamy1Department of Electronics & Communication Engineering PSG College of Technology Coimbatore641004 IndiaDepartment of Electronics & Communication Engineering PSG College of Technology Coimbatore641004 IndiaAbstract The use of counterfeit integrated circuits (ICs) in electronic products decreases its quality and lifetime. Recycled ICs can be detected by the method of aging analysis. Aging is carried out through reliability analysis with the effect of hot carrier injection and bias temperature instability (BTI). In this work, three machine learning methods, namely K‐means clustering, back propagation neural network (BPNN) and support vector machines (SVMs), are used to detect the recycled IC aged for a shorter period (1 day) with minimum data size. This work also distinguishes the effects of degradation due to process variations and reliability effects. The reliability and Monte Carlo simulation are performed on benchmark circuits such as c17, s27, b02 and fully differential folded‐cascode amplifier using the Cadence Virtuoso tool, and the parameters such as minimum voltage, delay value, supply current, gain, phase margin and bandwidth are measured. Machine learning methods are developed using MATLAB to train and classify the parameters. From the results obtained, it is observed that the classification rate for the benchmark circuits is 100%, and using BPNN, K‐means clustering and SVM and the proposed method, recycled IC or used IC is detected even if it was used for 1 day.https://doi.org/10.1049/cdt2.12005ageingbackpropagationcircuit analysis computingdifferential amplifiershot carriersintegrated circuit modelling |
| spellingShingle | Udaya Shankar Santhana Krishnan Kalpana Palanisamy Recycled integrated circuit detection using reliability analysis and machine learning algorithms IET Computers & Digital Techniques ageing backpropagation circuit analysis computing differential amplifiers hot carriers integrated circuit modelling |
| title | Recycled integrated circuit detection using reliability analysis and machine learning algorithms |
| title_full | Recycled integrated circuit detection using reliability analysis and machine learning algorithms |
| title_fullStr | Recycled integrated circuit detection using reliability analysis and machine learning algorithms |
| title_full_unstemmed | Recycled integrated circuit detection using reliability analysis and machine learning algorithms |
| title_short | Recycled integrated circuit detection using reliability analysis and machine learning algorithms |
| title_sort | recycled integrated circuit detection using reliability analysis and machine learning algorithms |
| topic | ageing backpropagation circuit analysis computing differential amplifiers hot carriers integrated circuit modelling |
| url | https://doi.org/10.1049/cdt2.12005 |
| work_keys_str_mv | AT udayashankarsanthanakrishnan recycledintegratedcircuitdetectionusingreliabilityanalysisandmachinelearningalgorithms AT kalpanapalanisamy recycledintegratedcircuitdetectionusingreliabilityanalysisandmachinelearningalgorithms |