Krishnan, U. S. S., & Palanisamy, K. Recycled integrated circuit detection using reliability analysis and machine learning algorithms. Wiley.
Chicago Style (17th ed.) CitationKrishnan, Udaya Shankar Santhana, and Kalpana Palanisamy. Recycled Integrated Circuit Detection Using Reliability Analysis and Machine Learning Algorithms. Wiley.
MLA (9th ed.) CitationKrishnan, Udaya Shankar Santhana, and Kalpana Palanisamy. Recycled Integrated Circuit Detection Using Reliability Analysis and Machine Learning Algorithms. Wiley.
Warning: These citations may not always be 100% accurate.