E-k Relation of Valence Band in Arbitrary Orientation/Typical Plane Uniaxially Strained

Uniaxial strain technology is an effective way to improve the performance of the small size CMOS devices, by which carrier mobility can be enhanced. The E-k relation of the valence band in uniaxially strained Si is the theoretical basis for understanding and enhancing hole mobility. The solving proc...

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Main Authors: Zhang Chao, Xu Da-Qing, Liu Shu-Lin, Liu Ning-Zhuang
Format: Article
Language:English
Published: Wiley 2014-01-01
Series:Advances in Condensed Matter Physics
Online Access:http://dx.doi.org/10.1155/2014/686303
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author Zhang Chao
Xu Da-Qing
Liu Shu-Lin
Liu Ning-Zhuang
author_facet Zhang Chao
Xu Da-Qing
Liu Shu-Lin
Liu Ning-Zhuang
author_sort Zhang Chao
collection DOAJ
description Uniaxial strain technology is an effective way to improve the performance of the small size CMOS devices, by which carrier mobility can be enhanced. The E-k relation of the valence band in uniaxially strained Si is the theoretical basis for understanding and enhancing hole mobility. The solving procedure of the relation and its analytic expression were still lacking, and the compressive results of the valence band parameters in uniaxially strained Si were not found in the references. So, the E-k relation has been derived by taking strained Hamiltonian perturbation into account. And then the valence band parameters were obtained, including the energy levels at Γ point, the splitting energy, and hole effective masses. Our analytic models and quantized results will provide significant theoretical references for the understanding of the strained materials physics and its design.
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institution Kabale University
issn 1687-8108
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language English
publishDate 2014-01-01
publisher Wiley
record_format Article
series Advances in Condensed Matter Physics
spelling doaj-art-b436ed33d8b649fe9ce0b35e5640f6792025-02-03T01:00:54ZengWileyAdvances in Condensed Matter Physics1687-81081687-81242014-01-01201410.1155/2014/686303686303E-k Relation of Valence Band in Arbitrary Orientation/Typical Plane Uniaxially StrainedZhang Chao0Xu Da-Qing1Liu Shu-Lin2Liu Ning-Zhuang3School of Electrical and Control Engineering, Xi'an University of Science and Technology, Xi'an 710054, ChinaSchool of Electrical and Control Engineering, Xi'an University of Science and Technology, Xi'an 710054, ChinaSchool of Electrical and Control Engineering, Xi'an University of Science and Technology, Xi'an 710054, ChinaSchool of Electrical and Control Engineering, Xi'an University of Science and Technology, Xi'an 710054, ChinaUniaxial strain technology is an effective way to improve the performance of the small size CMOS devices, by which carrier mobility can be enhanced. The E-k relation of the valence band in uniaxially strained Si is the theoretical basis for understanding and enhancing hole mobility. The solving procedure of the relation and its analytic expression were still lacking, and the compressive results of the valence band parameters in uniaxially strained Si were not found in the references. So, the E-k relation has been derived by taking strained Hamiltonian perturbation into account. And then the valence band parameters were obtained, including the energy levels at Γ point, the splitting energy, and hole effective masses. Our analytic models and quantized results will provide significant theoretical references for the understanding of the strained materials physics and its design.http://dx.doi.org/10.1155/2014/686303
spellingShingle Zhang Chao
Xu Da-Qing
Liu Shu-Lin
Liu Ning-Zhuang
E-k Relation of Valence Band in Arbitrary Orientation/Typical Plane Uniaxially Strained
Advances in Condensed Matter Physics
title E-k Relation of Valence Band in Arbitrary Orientation/Typical Plane Uniaxially Strained
title_full E-k Relation of Valence Band in Arbitrary Orientation/Typical Plane Uniaxially Strained
title_fullStr E-k Relation of Valence Band in Arbitrary Orientation/Typical Plane Uniaxially Strained
title_full_unstemmed E-k Relation of Valence Band in Arbitrary Orientation/Typical Plane Uniaxially Strained
title_short E-k Relation of Valence Band in Arbitrary Orientation/Typical Plane Uniaxially Strained
title_sort e k relation of valence band in arbitrary orientation typical plane uniaxially strained
url http://dx.doi.org/10.1155/2014/686303
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AT xudaqing ekrelationofvalencebandinarbitraryorientationtypicalplaneuniaxiallystrained
AT liushulin ekrelationofvalencebandinarbitraryorientationtypicalplaneuniaxiallystrained
AT liuningzhuang ekrelationofvalencebandinarbitraryorientationtypicalplaneuniaxiallystrained