A Comparative Study of Supervised and Self-Supervised Denoising Techniques for Defect Segmentation in Industrial CT Imaging

A Comparative Study of Supervised and Self-Supervised Denoising Techniques for Defect Segmentation in Industrial CT Imaging

X-ray computed tomography (CT) is a powerful imaging tool for defect detection, segmentation and feature extraction in industrial applications as it enables non-destructive evaluation. The presence of artifacts and noise, however, imposes difficulties on the defect detection due to low contrast bet...

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Bibliographic Details
Main Authors: Virginia Florian, Jiayang Shi, Willem Jan Palestijn, Daniël M. Pelt, K. Joost Batenburg, Thomas Lang, Christoph Heinzl, Christian Kretzer, Stefan Kasperl, Dominik Wolfschläger, Robert H. Schmitt
Format: Article
Language:deu
Published: NDT.net 2025-02-01
Series:e-Journal of Nondestructive Testing
Online Access:https://www.ndt.net/search/docs.php3?id=30735
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