Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual‐material gate‐oxide‐stack double‐gate TFET
Abstract This article presents an investigation report of the effects of temperature variation in the range of 300 to 480 K on electrical performance parameters of conventional dual‐material double‐gate tunnel field effect transistor (DMDG‐TFET) and dual‐material gate‐oxide‐stack double‐gate tunnel...
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| Format: | Article |
| Language: | English |
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Wiley
2021-09-01
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| Series: | IET Circuits, Devices and Systems |
| Online Access: | https://doi.org/10.1049/cds2.12049 |
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| author | Satyendra Kumar |
| author_facet | Satyendra Kumar |
| author_sort | Satyendra Kumar |
| collection | DOAJ |
| description | Abstract This article presents an investigation report of the effects of temperature variation in the range of 300 to 480 K on electrical performance parameters of conventional dual‐material double‐gate tunnel field effect transistor (DMDG‐TFET) and dual‐material gate‐oxide‐stack double‐gate tunnel field effect transistor (DMGOSDG‐TFET). This report shows an analysis and comparison of the impacts of operating temperature variation on both the devices in terms of DC, analogue/RF, linearity and harmonic distortion parameters with the help of simulation results obtained using a numerical device simulator. It could be stated that DMGOSDG‐TFET is more insensitive with respect to temperature variation in terms of DC, analogue/RF and linearity performances as compared to conventional DMDG‐TFET. Moreover, in terms of harmonic distortion characteristics DMGOSDG‐TFET is found to be more stable with temperature variation as compared to DMDG‐TFET. |
| format | Article |
| id | doaj-art-af1f298cca274227a499095fbde555b7 |
| institution | Kabale University |
| issn | 1751-858X 1751-8598 |
| language | English |
| publishDate | 2021-09-01 |
| publisher | Wiley |
| record_format | Article |
| series | IET Circuits, Devices and Systems |
| spelling | doaj-art-af1f298cca274227a499095fbde555b72025-02-03T06:47:36ZengWileyIET Circuits, Devices and Systems1751-858X1751-85982021-09-0115654055210.1049/cds2.12049Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual‐material gate‐oxide‐stack double‐gate TFETSatyendra Kumar0Department of Electronics and Communication Engineering Jaypee Institute of Information Technology Noida Uttar Pradesh IndiaAbstract This article presents an investigation report of the effects of temperature variation in the range of 300 to 480 K on electrical performance parameters of conventional dual‐material double‐gate tunnel field effect transistor (DMDG‐TFET) and dual‐material gate‐oxide‐stack double‐gate tunnel field effect transistor (DMGOSDG‐TFET). This report shows an analysis and comparison of the impacts of operating temperature variation on both the devices in terms of DC, analogue/RF, linearity and harmonic distortion parameters with the help of simulation results obtained using a numerical device simulator. It could be stated that DMGOSDG‐TFET is more insensitive with respect to temperature variation in terms of DC, analogue/RF and linearity performances as compared to conventional DMDG‐TFET. Moreover, in terms of harmonic distortion characteristics DMGOSDG‐TFET is found to be more stable with temperature variation as compared to DMDG‐TFET.https://doi.org/10.1049/cds2.12049 |
| spellingShingle | Satyendra Kumar Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual‐material gate‐oxide‐stack double‐gate TFET IET Circuits, Devices and Systems |
| title | Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual‐material gate‐oxide‐stack double‐gate TFET |
| title_full | Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual‐material gate‐oxide‐stack double‐gate TFET |
| title_fullStr | Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual‐material gate‐oxide‐stack double‐gate TFET |
| title_full_unstemmed | Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual‐material gate‐oxide‐stack double‐gate TFET |
| title_short | Temperature dependence of analogue/RF performance, linearity and harmonic distortion for dual‐material gate‐oxide‐stack double‐gate TFET |
| title_sort | temperature dependence of analogue rf performance linearity and harmonic distortion for dual material gate oxide stack double gate tfet |
| url | https://doi.org/10.1049/cds2.12049 |
| work_keys_str_mv | AT satyendrakumar temperaturedependenceofanaloguerfperformancelinearityandharmonicdistortionfordualmaterialgateoxidestackdoublegatetfet |