Li, X., Pedrini, G., & Fu, Y. Optical Metrology under Extreme Conditions. Wiley.
Chicago Style (17th ed.) CitationLi, Xide, Giancarlo Pedrini, and Yu Fu. Optical Metrology Under Extreme Conditions. Wiley.
MLA (9th ed.) CitationLi, Xide, et al. Optical Metrology Under Extreme Conditions. Wiley.
Warning: These citations may not always be 100% accurate.