Probing Electric Field in an Enclosed Field Mapper for Characterizing Metamaterials

Spatially mapping electromagnetic fields in the quasi-two-dimensional field mapper (a parallel plate waveguiding system; Justice et al. (2006)) for characterizing metamaterial devices, especially those integrating the metal boundary, may encounter troubles including electromagnetic leakage caused by...

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Main Authors: Sucheng Li, Chendong Gu, Yadong Xu, Shahzad Anwar, Weixin Lu, Zhi Hong Hang, Bo Hou, Huanyang Chen
Format: Article
Language:English
Published: Wiley 2014-01-01
Series:International Journal of Antennas and Propagation
Online Access:http://dx.doi.org/10.1155/2014/728756
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author Sucheng Li
Chendong Gu
Yadong Xu
Shahzad Anwar
Weixin Lu
Zhi Hong Hang
Bo Hou
Huanyang Chen
author_facet Sucheng Li
Chendong Gu
Yadong Xu
Shahzad Anwar
Weixin Lu
Zhi Hong Hang
Bo Hou
Huanyang Chen
author_sort Sucheng Li
collection DOAJ
description Spatially mapping electromagnetic fields in the quasi-two-dimensional field mapper (a parallel plate waveguiding system; Justice et al. (2006)) for characterizing metamaterial devices, especially those integrating the metal boundary, may encounter troubles including electromagnetic leakage caused by the air gap and energy guiding along finitely high metal walls. To eradicate them, a moving contact approach is proposed. The physical air gap between the mobile metal walls and the stationary upper plate of the mapper is closed, while their relative movement is still allowed during the field mapping. We demonstrate the method of closing the gap by mapping the E-field distribution in a rectangular waveguide.
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institution Kabale University
issn 1687-5869
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language English
publishDate 2014-01-01
publisher Wiley
record_format Article
series International Journal of Antennas and Propagation
spelling doaj-art-ae44b2aaba4044818bddfe881c7ae37a2025-02-03T01:21:56ZengWileyInternational Journal of Antennas and Propagation1687-58691687-58772014-01-01201410.1155/2014/728756728756Probing Electric Field in an Enclosed Field Mapper for Characterizing MetamaterialsSucheng Li0Chendong Gu1Yadong Xu2Shahzad Anwar3Weixin Lu4Zhi Hong Hang5Bo Hou6Huanyang Chen7College of Physics, Optoelectronics and Energy, Soochow University, 1 Shizi Street, Suzhou 215006, ChinaCollege of Physics, Optoelectronics and Energy, Soochow University, 1 Shizi Street, Suzhou 215006, ChinaCollege of Physics, Optoelectronics and Energy, Soochow University, 1 Shizi Street, Suzhou 215006, ChinaCollege of Physics, Optoelectronics and Energy, Soochow University, 1 Shizi Street, Suzhou 215006, ChinaCollege of Physics, Optoelectronics and Energy, Soochow University, 1 Shizi Street, Suzhou 215006, ChinaCollege of Physics, Optoelectronics and Energy, Soochow University, 1 Shizi Street, Suzhou 215006, ChinaCollege of Physics, Optoelectronics and Energy, Soochow University, 1 Shizi Street, Suzhou 215006, ChinaCollege of Physics, Optoelectronics and Energy, Soochow University, 1 Shizi Street, Suzhou 215006, ChinaSpatially mapping electromagnetic fields in the quasi-two-dimensional field mapper (a parallel plate waveguiding system; Justice et al. (2006)) for characterizing metamaterial devices, especially those integrating the metal boundary, may encounter troubles including electromagnetic leakage caused by the air gap and energy guiding along finitely high metal walls. To eradicate them, a moving contact approach is proposed. The physical air gap between the mobile metal walls and the stationary upper plate of the mapper is closed, while their relative movement is still allowed during the field mapping. We demonstrate the method of closing the gap by mapping the E-field distribution in a rectangular waveguide.http://dx.doi.org/10.1155/2014/728756
spellingShingle Sucheng Li
Chendong Gu
Yadong Xu
Shahzad Anwar
Weixin Lu
Zhi Hong Hang
Bo Hou
Huanyang Chen
Probing Electric Field in an Enclosed Field Mapper for Characterizing Metamaterials
International Journal of Antennas and Propagation
title Probing Electric Field in an Enclosed Field Mapper for Characterizing Metamaterials
title_full Probing Electric Field in an Enclosed Field Mapper for Characterizing Metamaterials
title_fullStr Probing Electric Field in an Enclosed Field Mapper for Characterizing Metamaterials
title_full_unstemmed Probing Electric Field in an Enclosed Field Mapper for Characterizing Metamaterials
title_short Probing Electric Field in an Enclosed Field Mapper for Characterizing Metamaterials
title_sort probing electric field in an enclosed field mapper for characterizing metamaterials
url http://dx.doi.org/10.1155/2014/728756
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