Teh, H. Y., Wang, K. I., & Kempa-Liehr, A. W. Feature-Based Normality Models for Anomaly Detection. MDPI AG.
Chicago Style (17th ed.) CitationTeh, Hui Yie, Kevin I-Kai Wang, and Andreas W. Kempa-Liehr. Feature-Based Normality Models for Anomaly Detection. MDPI AG.
MLA (9th ed.) CitationTeh, Hui Yie, et al. Feature-Based Normality Models for Anomaly Detection. MDPI AG.
Warning: These citations may not always be 100% accurate.