Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization
This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standar...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
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Wiley
2012-01-01
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| Series: | International Journal of Photoenergy |
| Online Access: | http://dx.doi.org/10.1155/2012/324853 |
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| _version_ | 1832565120614531072 |
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| author | Jiří Vanek Jan Dolensky Zdenek Chobola Mirek Luňák Aleš Poruba |
| author_facet | Jiří Vanek Jan Dolensky Zdenek Chobola Mirek Luňák Aleš Poruba |
| author_sort | Jiří Vanek |
| collection | DOAJ |
| description | This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process. |
| format | Article |
| id | doaj-art-ab42257c3e944a8ebdfed04ebfe95b7a |
| institution | Kabale University |
| issn | 1110-662X 1687-529X |
| language | English |
| publishDate | 2012-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | International Journal of Photoenergy |
| spelling | doaj-art-ab42257c3e944a8ebdfed04ebfe95b7a2025-02-03T01:09:14ZengWileyInternational Journal of Photoenergy1110-662X1687-529X2012-01-01201210.1155/2012/324853324853Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell CharacterizationJiří Vanek0Jan Dolensky1Zdenek Chobola2Mirek Luňák3Aleš Poruba4Department of Electrotechnology, Faculty of Electrical Engineering and Communication, Brno University of Technology, Udolni 53, 602 00 Brno, Czech RepublicDepartment of Electrotechnology, Faculty of Electrical Engineering and Communication, Brno University of Technology, Udolni 53, 602 00 Brno, Czech RepublicDepartment of Physics, Faculty of Civil Engineering, Brno University of Technology, Žižkova 17, 602 00 Brno, Czech RepublicDepartment of Physics, Faculty of Civil Engineering, Brno University of Technology, Žižkova 17, 602 00 Brno, Czech RepublicDepartment of Solar-Cells, Solartec s.r.o., Televizní 2618, 765 61 Rožnov pod Radhoštěm, Czech RepublicThis paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.http://dx.doi.org/10.1155/2012/324853 |
| spellingShingle | Jiří Vanek Jan Dolensky Zdenek Chobola Mirek Luňák Aleš Poruba Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization International Journal of Photoenergy |
| title | Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization |
| title_full | Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization |
| title_fullStr | Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization |
| title_full_unstemmed | Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization |
| title_short | Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization |
| title_sort | low frequency noise and microplasma analysis for c si solar cell characterization |
| url | http://dx.doi.org/10.1155/2012/324853 |
| work_keys_str_mv | AT jirivanek lowfrequencynoiseandmicroplasmaanalysisforcsisolarcellcharacterization AT jandolensky lowfrequencynoiseandmicroplasmaanalysisforcsisolarcellcharacterization AT zdenekchobola lowfrequencynoiseandmicroplasmaanalysisforcsisolarcellcharacterization AT mireklunak lowfrequencynoiseandmicroplasmaanalysisforcsisolarcellcharacterization AT alesporuba lowfrequencynoiseandmicroplasmaanalysisforcsisolarcellcharacterization |