Vanek, J., Dolensky, J., Chobola, Z., Luňák, M., & Poruba, A. Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization. Wiley.
Chicago Style (17th ed.) CitationVanek, Jiří, Jan Dolensky, Zdenek Chobola, Mirek Luňák, and Aleš Poruba. Low-Frequency Noise and Microplasma Analysis for C-Si Solar Cell Characterization. Wiley.
MLA (9th ed.) CitationVanek, Jiří, et al. Low-Frequency Noise and Microplasma Analysis for C-Si Solar Cell Characterization. Wiley.
Warning: These citations may not always be 100% accurate.