Enhancement study of electronic component size measurement and defect detection based on machine vision
This paper is based on machine vision technology, combined with Halcon software, based on electronic components’ size measurement and defect detection. First, the application status and research significance of machine vision technology in the field of electronic components are introduced. The camer...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2025-06-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0256933 |
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