Spatial Patterns in Fibrous Materials: A Metrological Framework for Pores and Junctions
Several materials widely used in scientific research and industrial applications, including nano-filters and neuromorphic circuits, consist of fiber structures. Despite the fundamental structural similarity, the key feature that should be considered depends on the specific application. In the case o...
Saved in:
| Main Authors: | Efi-Maria Papia, Vassilios Constantoudis, Youmin Hou, Prexa Shah, Michael Kappl, Evangelos Gogolides |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-05-01
|
| Series: | Metrology |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2673-8244/5/2/26 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Computational methods in nanometrology: the challenges of resolution and stochasticity
by: Alex Kondi, et al.
Published: (2025-05-01) -
Mathematical and Software for Determining the Error in Solving Metrological Analysis Problems
by: E. N. Zhdanova, et al.
Published: (2024-12-01) -
AUTOMATION OF METROLOGICAL MAINTENANCE AT THE ENTERPRISES
by: I.G. KOSHLYAKOVA, et al.
Published: (2010-06-01) -
Geometric Characterisation of Stochastic Fibrous Networks: A Comprehensive Review
by: Yagiz Kayali, et al.
Published: (2025-03-01) -
The Silent Benefactor: Why Explaining the Importance of Metrology Involves Addressing the Counterfactual
by: Richard J. C. Brown, et al.
Published: (2025-05-01)