APA (7th ed.) Citation

Dutt, S., Chakraborty, R., Notthoff, C., Mota-Santiago, P., Trautmann, C., & Kluth, P. Characterization of ion track-etched conical nanopores in thermal and PECVD SiO2 using small angle X-ray scattering. Beilstein-Institut.

Chicago Style (17th ed.) Citation

Dutt, Shankar, Rudradeep Chakraborty, Christian Notthoff, Pablo Mota-Santiago, Christina Trautmann, and Patrick Kluth. Characterization of Ion Track-etched Conical Nanopores in Thermal and PECVD SiO2 Using Small Angle X-ray Scattering. Beilstein-Institut.

MLA (9th ed.) Citation

Dutt, Shankar, et al. Characterization of Ion Track-etched Conical Nanopores in Thermal and PECVD SiO2 Using Small Angle X-ray Scattering. Beilstein-Institut.