Non-Linear Characterization of Memoryless SSP Amplifiers
This paper describes a testbed, which is able to generate all of the standard test signals used for characterising nonlinear amplifiers. The testbed is shown to be sufficiently linear to avoid any possible masking of the non-linear effects of the amplifier under test. All the standard tests: single-...
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| Format: | Article |
| Language: | English |
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Wiley
2002-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1080/08827510213498 |
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| _version_ | 1849400158348902400 |
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| author | N. T. Ali |
| author_facet | N. T. Ali |
| author_sort | N. T. Ali |
| collection | DOAJ |
| description | This paper describes a testbed, which is able to generate all of the standard test signals used for characterising nonlinear amplifiers. The testbed is shown to be sufficiently linear to avoid any possible masking of the non-linear effects of the amplifier under test. All the standard tests: single-carrier, two-carrier, multi-carrier and NPR are applied to a laboratory amplifier and their results found to be in reasonably good agreement with the most popular prediction techniques. The merits of the individual test have been highlighted. |
| format | Article |
| id | doaj-art-a0958fdc2b1d4eefa570403cf69a0621 |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 2002-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-a0958fdc2b1d4eefa570403cf69a06212025-08-20T03:38:09ZengWileyActive and Passive Electronic Components0882-75161563-50312002-01-0125324926410.1080/08827510213498Non-Linear Characterization of Memoryless SSP AmplifiersN. T. Ali0Etisalat College of Engineering, Sharjah, United Arab EmiratesThis paper describes a testbed, which is able to generate all of the standard test signals used for characterising nonlinear amplifiers. The testbed is shown to be sufficiently linear to avoid any possible masking of the non-linear effects of the amplifier under test. All the standard tests: single-carrier, two-carrier, multi-carrier and NPR are applied to a laboratory amplifier and their results found to be in reasonably good agreement with the most popular prediction techniques. The merits of the individual test have been highlighted.http://dx.doi.org/10.1080/08827510213498 |
| spellingShingle | N. T. Ali Non-Linear Characterization of Memoryless SSP Amplifiers Active and Passive Electronic Components |
| title | Non-Linear Characterization of Memoryless SSP Amplifiers |
| title_full | Non-Linear Characterization of Memoryless SSP Amplifiers |
| title_fullStr | Non-Linear Characterization of Memoryless SSP Amplifiers |
| title_full_unstemmed | Non-Linear Characterization of Memoryless SSP Amplifiers |
| title_short | Non-Linear Characterization of Memoryless SSP Amplifiers |
| title_sort | non linear characterization of memoryless ssp amplifiers |
| url | http://dx.doi.org/10.1080/08827510213498 |
| work_keys_str_mv | AT ntali nonlinearcharacterizationofmemorylesssspamplifiers |