Inhibition of Anti-Reflection Film Cracks on Plastic Substrates Using Nanolaminate Layer Deposition in Plasma-Enhanced Atomic Layer Deposition
In this research, we mainly increase the adhesion of PMMA substrate and film, which is reflected in the environmental test. This study used plasma-enhanced atomic layer deposition (PEALD) to find the relationship between the intensity of XRD reflection peak and the root-mean-square surface roughness...
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Main Authors: | Chi-Chieh Wang, Cheng-Fu Wang, Meng-Chi Li, Li-Chen Su, Chien-Cheng Kuo |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2024-12-01
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Series: | Technologies |
Subjects: | |
Online Access: | https://www.mdpi.com/2227-7080/13/1/11 |
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