APA (7th ed.) Citation

Zhang, Y., Li, X., & Zhao, J. Dynamic Modeling of Stress-Induced Defect Expansion in VCSELs. IEEE.

Chicago Style (17th ed.) Citation

Zhang, Yuqi, Xun Li, and Jia Zhao. Dynamic Modeling of Stress-Induced Defect Expansion in VCSELs. IEEE.

MLA (9th ed.) Citation

Zhang, Yuqi, et al. Dynamic Modeling of Stress-Induced Defect Expansion in VCSELs. IEEE.